MKM Measurement Microscopes
The mounting of our unique focus target allows for contactless height measurements with no room for human error.
We have prepared all kinds of measurement stages and objective lenses to respond to all kinds of customer measurement requirements.
Using a target mark allows for high-precision height and difference measurements. Here, you can choose from different varieties of stage size and magnification to find a model that suits your needs.
|Customizable stage||100 x 50mm, 150 x 100mm, 300 x 300mm||Stage Resolution 0.5μｍ|
|Lens||5x, 10x, 20x, 50x, 100x|
A superbly cost-effective stereo microscope. This microscope has an excellent resolution and is perfect for your manufacturing and inspection needs. Choose from multiple varieties of stands and lighting.
|Ocular Lens||WF10x (Field No.: 22),15x, 20x, 25x|
|Zoom Magnification||0.65x-4.5x (Zoom Ratio 6.9:1)|
|Total Magnification||6.5x-45x (for 10x lens)|
|Field of View||34mm-5mm|
|Working Distance||103mm for 1x, 163mm for 0.5x, 117mm for 0.75x, 45mm for 1.5x, 40mm for 2x|
|Lens Barrel Angle||45° 60°|
|Lighting||Fluorescent ring lamp lighting 8W/110V, LED ring lamp lighting 3.5W|
|Stands||Standard stand, large stand, universal stand, ST-U1 transilluminator-fitted stand, adjustable stand|
|Auxiliary Objective Lens||0.5x, 0.75x, 1.5x, 2.0x|
|Actual Weight||Approx. 1.5kg|
View the catalog here
KLM Line Width Measurement Device
This device makes it possible to measure the width of microscopic lines.
High-precision and high-reproducibility via image processing
Automatic measurements using the AF function
Measurement reproducibility: σ＝0.5μｍ or under
Wafer Warpage Measurement Devices
Using a special contactless sensor, you can measure the surface form of the wafer.
You can also carry out automatic measurements by combining this device with an automatic stage.
Perfect for wafer warpage management in semiconductor processing.
Please get in contact for more details.
We can make each kind of measurement device to order.
We will propose equipment based on what measurements are to be made and budget.