Measurement & Optical Products

MKM Measurement Microscopes

The mounting of our unique focus target allows for contactless height measurements with no room for human error.
We have prepared all kinds of measurement stages and objective lenses to respond to all kinds of customer measurement requirements.


Using a target mark allows for high-precision height and difference measurements. Here, you can choose from different varieties of stage size and magnification to find a model that suits your needs.

Customizable stage 100 x 50mm, 150 x 100mm, 300 x 300mm Stage Resolution 0.5μm
Lens 5x, 10x, 20x, 50x, 100x

View the catalog here

Stereo Microscope

A superbly cost-effective stereo microscope. This microscope has an excellent resolution and is perfect for your manufacturing and inspection needs. Choose from multiple varieties of stands and lighting.

  • MZ45 Binocular Stereo Microscope 45°
    MZ45 Binocular Stereo Microscope 45°
  • MZ45T Trinocular Stereo Microscope
    MZ45T Trinocular Stereo Microscope
  • MZ60 Binocular Stereo Microscope 60°
    MZ60 Binocular Stereo Microscope 60°
MZ45/45T         MZ60
Ocular Lens WF10x (Field No.: 22),15x, 20x, 25x
Zoom Magnification 0.65x-4.5x (Zoom Ratio 6.9:1)
Total Magnification 6.5x-45x (for 10x lens)
Field of View 34mm-5mm
Working Distance 103mm for 1x, 163mm for 0.5x, 117mm for 0.75x, 45mm for 1.5x, 40mm for 2x
Lens Barrel Angle 45°           60°
Lighting Fluorescent ring lamp lighting 8W/110V, LED ring lamp lighting 3.5W
Stands Standard stand, large stand, universal stand, ST-U1 transilluminator-fitted stand, adjustable stand
Auxiliary Objective Lens 0.5x, 0.75x, 1.5x, 2.0x
Actual Weight Approx. 1.5kg
  • 実体顕微鏡カタログ1
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KLM Line Width Measurement Device

This device makes it possible to measure the width of microscopic lines.
High-precision and high-reproducibility via image processing
Automatic measurements using the AF function
Measurement reproducibility: σ=0.5μm or under

KLM Line Width Measurement Device

Wafer Warpage Measurement Devices

Using a special contactless sensor, you can measure the surface form of the wafer.
You can also carry out automatic measurements by combining this device with an automatic stage.
Perfect for wafer warpage management in semiconductor processing.
Please get in contact for more details.


We can make each kind of measurement device to order.
We will propose equipment based on what measurements are to be made and budget.